Ionizing radiation effects on a 64-channel charge measurement ASIC designed in CMOS 0.35 μm technology
- La Rosa, A.
- Marchetto, F.
- Pardo, J.
- Donetti, M.
- Attili, A.
- Bourhaleb, F.
- Cirio, R.
- Garella, M.A.
- Giordanengo, S.
- Givehchi, N.
- Iliescu, S.
- Mazza, G.
- Pecka, A.
- Peroni, C.
- Pittà, G.
ISSN: 0168-9002
Year of publication: 2008
Volume: 593
Issue: 3
Pages: 619-623
Type: Article